Items where Author is "Kamaruddin, Mohd. Hanif"
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Number of items: 2.
Article
Izzudin , Ismah and Kamaruddin , Mohd. Hanif and Nordin, Anis Nurashikin and Soin, Norhayati (2012) Trench DMOS interface trap characterization by three-terminal charge pumping measurement. Microelectronics Reliability, 52 (12). pp. 2914-2919.
Proceeding Paper
Izuddin, Ismah and Kamaruddin, Mohd. Hanif and Nordin, Anis Nurashikin (2011) Modeling of the reliability baseline for process control monitoring kerf structures. In: 2011 IEEE Regional Symposium on Micro and Nanoelectronics (RSM), 28-30 September, Kota Kinabalu, Malaysia.